Accelerating vacancy diffusion calculations by a DFT informed modified gaussian process regression method: A case study of austenitic 316 stainless steel

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公式: f(x)=x⋅σ(x)

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SSIM (Structural Similarity Index Measure) compares two images by evaluating luminance, contrast, and structural patterns across local windows. It returns a score from -1 to 1: 1.0 means the images are pixel-identical, 0 means no structural correlation, and negative values mean the images are anti-correlated (less alike than random noise). For glyph comparison, it answers the question: do these two rendered characters share the same visual structure?

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